EE 7820 - Pattern Recognition

Credit Hour(s): 3

Course Description: Supervised and unsupervised classification are covered, including feature extraction, feature selection, distance measures, sequential clustering, hierarchical clustering, Bayesian decision theory, parameter estimation, and applications of pattern recognition.

Enrollment Restrictions: Must be enrolled in one of the following levels: Graduate, Medical, Professional.

Course Level: Graduate
Schedule Type(s): Lecture

Grade Mode: Standard
An additional fee is associated with this course.