EE 7540 - VLSI Testing and Design for Testability

Credit Hour(s): 3

Course Description: Design for testability of VLSI circuits. Topics include importance of testing, conventional test methods, built-in test, CAD tools for evaluating testability, test pattern generators and compressors; and test for mixed-signal systems and systems-on-a-chip (SOC).

Enrollment Restrictions: Must be enrolled in one of the following levels: Graduate, Medical, Professional.

Course Level: Graduate
Schedule Type(s): Lecture

Grade Mode: Standard
An additional fee is associated with this course.